"A cross-scale investigation on transient electrothermal performance for ..."

Yuxuan Dai et al. (2025)

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DOI: 10.1016/J.MEJO.2025.106561

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type: Journal Article

metadata version: 2025-02-01

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Yuxuan Dai, Jiafei Yao, Jing Chen, Maolin Zhang, Yucheng Xu, Qing Yao, Qingyou Qian, Jun Zhang, Kemeng Yang, Yufeng Guo:
A cross-scale investigation on transient electrothermal performance for power MOSFETs at device-package level. Microelectron. J. 156: 106561 (2025)

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