"Improving uniformity and reliability of SRAM PUFs utilizing device aging ..."

Achiranshu Garg et al. (2019)

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DOI: 10.1016/J.MEJO.2019.05.013

access: closed

type: Journal Article

metadata version: 2025-01-19

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Achiranshu Garg, Zhao Chuan Lee, Lu Lu, Tony Tae-Hyoung Kim:
Improving uniformity and reliability of SRAM PUFs utilizing device aging phenomenon for unique identifier generation. Microelectron. J. 90: 29-38 (2019)

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