"Precision measurement of ADC parameters with cumulative histogram ..."

Bhawana Garg, D. K. Mishra (2020)

> Home

Details and statistics

DOI: 10.1016/J.MEJO.2020.104875

access: closed

type: Journal Article

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/GargM20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/GargM20
Bhawana Garg, D. K. Mishra:
Precision measurement of ADC parameters with cumulative histogram technique using Gaussian noise. Microelectron. J. 104: 104875 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.