Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Total-ionization-dose characterization of a radiation-hardened ..."

X. Ge et al. (2019)

> Home

Details and statistics

DOI: 10.1016/J.MEJO.2019.04.007

access: closed

type: Journal Article

metadata version: 2023-01-26

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/GeGXZZLJLLS19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/GeGXZZLJLLS19
X. Ge, Wen Gao, Feng Xu, Chen Zhao, Yang Zhao, X. Li, D. Jiang, H. Liu, Y. Li, G. Sun:
Total-ionization-dose characterization of a radiation-hardened mixed-signal microcontroller SoC in 180 nm CMOS technology for nanosatellites. Microelectron. J. 87: 65-72 (2019)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.