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"Study on the electrical breakdown failure mode transition of TSV-RDL."

Tao Gong et al. (2023)

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DOI: 10.1016/J.MEJO.2023.105982

access: closed

type: Journal Article

metadata version: 2023-11-19

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  - journals/mj/GongCLLWYJF23
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  - https://dblp.org/rec/journals/mj/GongCLLWYJF23
Tao Gong, Si Chen, Kai Li, Guoyuan Li, Zhizhe Wang, Xiaofeng Yang, Xiaodong Jian, Zhiwei Fu:
Study on the electrical breakdown failure mode transition of TSV-RDL. Microelectron. J. 141: 105982 (2023)

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