"Numerical analysis of single-event hardened vertical GaN CAVET with source ..."

Liang Jing et al. (2025)

> Home

Details and statistics

DOI: 10.1016/J.MEJO.2025.106773

access: closed

type: Journal Article

metadata version: 2025-08-09

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mj/JingWLSHG25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mj/JingWLSHG25
Liang Jing, Yanjun Wu, Xingyu Luo, Jingyu Shen, Shengdong Hu, Sheng Gao:
Numerical analysis of single-event hardened vertical GaN CAVET with source extension and InGaN charge diversion layer. Microelectron. J. 163: 106773 (2025)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.