"Hydrogen and oxygen induced abnormal reliability degradation in flexible ..."

Dongbhin Kim, Kyeong-Bae Lee, Byoungdeog Choi (2025)

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DOI: 10.1016/J.MEJO.2025.106902

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type: Journal Article

metadata version: 2025-10-29

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Dongbhin Kim, Kyeong-Bae Lee, Byoungdeog Choi:
Hydrogen and oxygen induced abnormal reliability degradation in flexible top-gate amorphous In-Ga-Zn-O thin-film transistors under negative bias thermal illumination stress. Microelectron. J. 166: 106902 (2025)

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