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"Soft error study in double gated FinFET-based SRAM cells with simultaneous ..."

V. N. Ramakrishnan, R. Srinivasan (2012)

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DOI: 10.1016/J.MEJO.2012.05.014

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mj/RamakrishnanS12
V. N. Ramakrishnan, R. Srinivasan:
Soft error study in double gated FinFET-based SRAM cells with simultaneous and independent driven gates. Microelectron. J. 43(11): 888-893 (2012)

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