"Characterization method for thermal interface materials imitating an ..."

András Vass-Várnai, Zoltán Sárkány, Márta Rencz (2012)

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DOI: 10.1016/J.MEJO.2011.06.013

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mj/Vass-VarnaiSR12
András Vass-Várnai, Zoltán Sárkány, Márta Rencz:
Characterization method for thermal interface materials imitating an in-situ environment. Microelectron. J. 43(9): 661-668 (2012)

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