"Improvement of cell internal weak defects detection under process ..."

Hong Zhang et al. (2023)

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DOI: 10.1016/J.MEJO.2023.105841

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type: Journal Article

metadata version: 2023-07-12

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Hong Zhang, Huaguo Liang, Jiewen Hu, Zhiwei Shao, Maoxiang Yi, Yingchun Lu, Zhengfeng Huang:
Improvement of cell internal weak defects detection under process variation by optimizing test path and test pattern. Microelectron. J. 138: 105841 (2023)

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