"Pixel-patch combination loss for refined edge detection."

Wenlin Li et al. (2025)

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DOI: 10.1007/S13042-024-02338-6

access: closed

type: Journal Article

metadata version: 2025-03-03

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Wenlin Li, Wei Zhang, Yanyan Liu, Changsong Liu, Rudong Jing:
Pixel-patch combination loss for refined edge detection. Int. J. Mach. Learn. Cybern. 16(2): 1341-1354 (2025)

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