"Deep neural network for x-ray photoelectron spectroscopy data analysis."

Giovanni Drera, Chahan M. Kropf, L. Sangaletti (2020)

> Home

Details and statistics

DOI: 10.1088/2632-2153/AB5DA6

access: open

type: Journal Article

metadata version: 2025-11-23

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/mlst/DreraKS20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mlst/DreraKS20
Giovanni Drera, Chahan M. Kropf, L. Sangaletti:
Deep neural network for x-ray photoelectron spectroscopy data analysis. Mach. Learn. Sci. Technol. 1(1): 15008 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.