"A comprehensive model of PMOS NBTI degradation."

Muhammad Ashraful Alam, S. Mahapatra (2005)

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DOI: 10.1016/J.MICROREL.2004.03.019

access: closed

type: Journal Article

metadata version: 2020-02-22

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Muhammad Ashraful Alam, S. Mahapatra:
A comprehensive model of PMOS NBTI degradation. Microelectron. Reliab. 45(1): 71-81 (2005)

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