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"Applications of temperature phase measurements to IC testing."

Josep Altet et al. (2004)

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DOI: 10.1016/S0026-2714(03)00138-0

access: closed

type: Journal Article

metadata version: 2023-07-06

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Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby:
Applications of temperature phase measurements to IC testing. Microelectron. Reliab. 44(1): 95-103 (2004)

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