Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors ..."

N. Arpatzanis et al. (2008)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2007.11.003

access: closed

type: Journal Article

metadata version: 2022-09-13

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/ArpatzanisHTDTOK08
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/ArpatzanisHTDTOK08
N. Arpatzanis, Argyrios T. Hatzopoulos, Dimitrios H. Tassis, C. A. Dimitriadis, François Templier, Maher Oudwan, G. Kamarinos:
Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress. Microelectron. Reliab. 48(4): 531-536 (2008)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.