"Measurement of the transient junction temperature in MOSFET devices under ..."

Davide Barlini et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.008

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type: Journal Article

metadata version: 2020-02-22

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Davide Barlini, Mauro Ciappa, Michel Mermet-Guyennet, Wolfgang Fichtner:
Measurement of the transient junction temperature in MOSFET devices under operating conditions. Microelectron. Reliab. 47(9-11): 1707-1712 (2007)

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