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"Experimental verification of the usefulness of the nth power law MOSFET ..."
Néstor Berbel et al. (2011)
- Néstor Berbel, Raúl Fernández-García, Ignacio Gil, B. Li, Alexandre Boyer, Sonia Bendhia:
Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout. Microelectron. Reliab. 51(9-11): 1564-1567 (2011)
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