"Kelvin probe force microscopy - An appropriate tool for the electrical ..."

Werner Bergbauer et al. (2006)

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DOI: 10.1016/J.MICROREL.2006.07.064

access: closed

type: Journal Article

metadata version: 2023-09-27

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Werner Bergbauer, Thomas Lutz, Werner Frammelsberger, Guenther Benstetter:
Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of LED heterostructures. Microelectron. Reliab. 46(9-11): 1736-1740 (2006)

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