"Correlation of gate leakage and local strain distribution in GaN/AlGaN ..."

Mikael Broas et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.050

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type: Journal Article

metadata version: 2024-05-07

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Mikael Broas, Andreas Graff, Michél Simon-Najasek, David Poppitz, Frank Altmann, Helmut Jung, Hervé Blanck:
Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures. Microelectron. Reliab. 64: 541-546 (2016)

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