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"Ultra wide voltage range consideration of reliability-aware STT magnetic ..."
Hao Cai et al. (2015)
- Hao Cai, You Wang, Lirida A. B. Naviner, W. S. Zhao:
Ultra wide voltage range consideration of reliability-aware STT magnetic flip-flop in 28 nm FDSOI technology. Microelectron. Reliab. 55(9-10): 1323-1327 (2015)
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