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"Investigation of charge trapping/de-trapping induced operation lifetime ..."

Zigui Cao et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.09.001

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/CaoZZLK08
Zigui Cao, Bo Zhang, Xiong Zhang, Elton Lee, Weiran Kong:
Investigation of charge trapping/de-trapping induced operation lifetime degradation in triple SuperFlash^® memory cell. Microelectron. Reliab. 48(11-12): 1809-1814 (2008)

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