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"Simulation of failure time distributions of metal lines under ..."

M. R. Carriero, Stefano Di Pascoli, Giuseppe Iannaccone (2002)

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DOI: 10.1016/S0026-2714(02)00172-5

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. R. Carriero, Stefano Di Pascoli, Giuseppe Iannaccone:
Simulation of failure time distributions of metal lines under electromigration. Microelectron. Reliab. 42(9-11): 1469-1472 (2002)

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