"Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs."

M. Cäsar et al. (2011)

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DOI: 10.1016/J.MICROREL.2010.09.006

access: closed

type: Journal Article

metadata version: 2024-10-06

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M. Cäsar, Maximilian Dammann, Vladimir Polyakov, Patrick Waltereit, Rüdiger Quay, Michael Mikulla, Oliver Ambacher:
Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs. Microelectron. Reliab. 51(2): 224-228 (2011)

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