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"Geometric design for ultra-long needle probe card for digital light ..."

Hao-Yuan Chang et al. (2010)

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DOI: 10.1016/J.MICROREL.2009.11.013

access: closed

type: Journal Article

metadata version: 2022-10-02

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Hao-Yuan Chang, Wen-Fung Pan, Meng-Kai Shih, Yi-Shao Lai:
Geometric design for ultra-long needle probe card for digital light processing wafer testing. Microelectron. Reliab. 50(4): 556-563 (2010)

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