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"The phenomenon of tin pest: A review."

Ben Cornelius et al. (2017)

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DOI: 10.1016/J.MICROREL.2017.10.030

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - https://dblp.org/rec/journals/mr/CorneliusTRP17
Ben Cornelius, Shay Treivish, Yair Rosenthal, Michael G. Pecht:
The phenomenon of tin pest: A review. Microelectron. Reliab. 79: 175-192 (2017)

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