"Leakage currents and dielectric breakdown of ..."

Angel Cuadras et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.07.061

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type: Journal Article

metadata version: 2020-08-11

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Angel Cuadras, B. Garrido, J. R. Morante, Luis Fonseca:
Leakage currents and dielectric breakdown of Si_1-x-yGe_xC_y thermal oxides. Microelectron. Reliab. 48(10): 1635-1640 (2008)

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