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"Negative bias temperature instability in n-channel power VDMOSFETs."

Danijel Dankovic et al. (2008)

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DOI: 10.1016/J.MICROREL.2008.06.015

access: closed

type: Journal Article

metadata version: 2024-02-05

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  - https://dblp.org/rec/journals/mr/DankovicMDDGS08
Danijel Dankovic, Ivica Manic, Vojkan Davidovic, Snezana Djoric-Veljkovic, Snezana Golubovic, Ninoslav Stojadinovic:
Negative bias temperature instability in n-channel power VDMOSFETs. Microelectron. Reliab. 48(8-9): 1313-1317 (2008)

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