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"CADless laser assisted methodologies for failure analysis and device ..."
A. Deyine et al. (2010)
- A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis:
CADless laser assisted methodologies for failure analysis and device reliability. Microelectron. Reliab. 50(9-11): 1236-1240 (2010)
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