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"Low frequency noise in 0.12 mum partially and fully depleted SOI technology."
François Dieudonné et al. (2003)
- François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra:
Low frequency noise in 0.12 mum partially and fully depleted SOI technology. Microelectron. Reliab. 43(2): 243-248 (2003)
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