"Transient thermal analysis for accelerated reliability testing of LEDs."

Gordon Elger et al. (2016)

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DOI: 10.1016/J.MICROREL.2016.07.094

access: closed

type: Journal Article

metadata version: 2021-05-07

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Gordon Elger, Dominik Müller, Alexander Hanß, Maximilian Schmid, E. Liu, Udo Karbowski, Robert Derix:
Transient thermal analysis for accelerated reliability testing of LEDs. Microelectron. Reliab. 64: 605-609 (2016)

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