"Degradation mechanism of power devices under di/dt thermal shocks: turn-on ..."

Stéphane Forster, Thierry Lequeu, Robert Jérisian (2003)

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DOI: 10.1016/S0026-2714(02)00261-5

access: closed

type: Journal Article

metadata version: 2020-02-22

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Stéphane Forster, Thierry Lequeu, Robert Jérisian:
Degradation mechanism of power devices under di/dt thermal shocks: turn-on of a TRIAC in Q3. Microelectron. Reliab. 43(1): 89-98 (2003)

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