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"Characterization and modeling of flicker noise in junction field-effect ..."

Y. Fu, Hei Wong, Juin J. Liou (2007)

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DOI: 10.1016/J.MICROREL.2006.01.009

access: closed

type: Journal Article

metadata version: 2020-02-22

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Y. Fu, Hei Wong, Juin J. Liou:
Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation. Microelectron. Reliab. 47(1): 46-50 (2007)

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