"Exploration of robustness limits and ESD EMI impact in a protection device ..."

Philippe Galy, Wim Schoenmaker (2017)

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DOI: 10.1016/J.MICROREL.2017.06.073

access: closed

type: Journal Article

metadata version: 2020-02-22

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Philippe Galy, Wim Schoenmaker:
Exploration of robustness limits and ESD EMI impact in a protection device for advanced CMOS technology. Microelectron. Reliab. 76-77: 680-684 (2017)

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