"Process dependence of BTI reliability in advanced HK MG stacks."

Xavier Garros et al. (2009)

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DOI: 10.1016/J.MICROREL.2009.06.047

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type: Journal Article

metadata version: 2023-05-09

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Xavier Garros, Mikaël Cassé, M. Rafik, Claire Fenouillet-Béranger, Gilles Reimbold, François Martin, Claudia Wiemer, F. Boulanger:
Process dependence of BTI reliability in advanced HK MG stacks. Microelectron. Reliab. 49(9-11): 982-988 (2009)

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