Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Degradation of static and dynamic behavior of CMOS inverters during ..."

Simone Gerardin et al. (2006)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2006.07.052

access: closed

type: Journal Article

metadata version: 2022-10-02

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/GerardinGCPG06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/GerardinGCPG06
Simone Gerardin, Alessio Griffoni, Andrea Cester, Alessandro Paccagnella, G. Ghidini:
Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. Microelectron. Reliab. 46(9-11): 1669-1672 (2006)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.