BibTeX record journals/mr/GondaTBZDHE04

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@article{DBLP:journals/mr/GondaTBZDHE04,
  author    = {Viktor Gonda and
               Jaap M. J. den Toonder and
               Johan Beijer and
               G. Q. Zhang and
               Willem D. van Driel and
               Romano J. O. M. Hoofman and
               Leo J. Ernst},
  title     = {Prediction of thermo-mechanical integrity of wafer backend processes},
  journal   = {Microelectron. Reliab.},
  volume    = {44},
  number    = {12},
  pages     = {2011--2017},
  year      = {2004},
  url       = {https://doi.org/10.1016/j.microrel.2004.05.021},
  doi       = {10.1016/j.microrel.2004.05.021},
  timestamp = {Sat, 22 Feb 2020 19:28:28 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/GondaTBZDHE04.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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