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"Influence of γ-ray total dose radiation effect on the hot carrier ..."
Minru Hao et al. (2017)
- Minru Hao, Huiyong Hu, Chen-Guang Liao, Bin Wang, Haiyan Kang, He-Ming Zhang:
Influence of γ-ray total dose radiation effect on the hot carrier gate current of the uniaxial strained Si nano-scale NMOSFET. Microelectron. Reliab. 75: 69-76 (2017)
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