"Failure modes and effects analysis for high-power GaN-based light-emitting ..."

Ray-Hua Horng et al. (2012)

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DOI: 10.1016/J.MICROREL.2011.02.021

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ray-Hua Horng, Re-Ching Lin, Yi-Chen Chiang, Bing-Han Chuang, Hung-Lieh Hu, Chen-Peng Hsu:
Failure modes and effects analysis for high-power GaN-based light-emitting diodes package technology. Microelectron. Reliab. 52(5): 818-821 (2012)

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