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"Modelling negative bias temperature instabilities in advanced p-MOSFETs."

M. Houssa (2005)

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DOI: 10.1016/J.MICROREL.2004.03.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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M. Houssa:
Modelling negative bias temperature instabilities in advanced p-MOSFETs. Microelectron. Reliab. 45(1): 3-12 (2005)

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