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"A double snapback SCR ESD protection scheme for 28 nm CMOS process."

Tao Hu et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.03.010

access: closed

type: Journal Article

metadata version: 2020-02-22

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  - journals/mr/HuDJWXLL18
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  - https://dblp.org/rec/journals/mr/HuDJWXLL18
Tao Hu, Shurong Dong, Hao Jin, Hei Wong, Zekun Xu, Xiang Li, Juin J. Liou:
A double snapback SCR ESD protection scheme for 28 nm CMOS process. Microelectron. Reliab. 84: 20-25 (2018)

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