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"Statistical variability in FinFET devices with intrinsic parameter ..."

Chih-Hong Hwang, Yiming Li, Ming-Hung Han (2010)

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DOI: 10.1016/J.MICROREL.2010.01.041

access: closed

type: Journal Article

metadata version: 2023-02-24

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Chih-Hong Hwang, Yiming Li, Ming-Hung Han:
Statistical variability in FinFET devices with intrinsic parameter fluctuations. Microelectron. Reliab. 50(5): 635-638 (2010)

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