"Comparative study of NBTI as a function of Si film orientation and ..."

Sung Jun Jang et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.07.015

access: closed

type: Journal Article

metadata version: 2022-10-02

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Sung Jun Jang, Dae Hyun Ka, Chong-Gun Yu, Kwan-Su Kim, Won-Ju Cho, Jong Tae Park:
Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs. Microelectron. Reliab. 47(9-11): 1411-1415 (2007)

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