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"A brief overview of gate oxide defect properties and their relation to ..."

Ben Kaczer et al. (2018)

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DOI: 10.1016/J.MICROREL.2017.11.022

access: closed

type: Journal Article

metadata version: 2023-05-24

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Ben Kaczer, Jacopo Franco, Pieter Weckx, Philippe Roussel, Vamsi Putcha, Erik Bury, Marko Simicic, Adrian Vaisman Chasin, Dimitri Linten, Bertrand Parvais, Francky Catthoor, Gerhard Rzepa, Michael Waltl, Tibor Grasser:
A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability. Microelectron. Reliab. 81: 186-194 (2018)

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