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"Evaluation of gate oxide breakdown effect on cascode class E power ..."

Karan Kutty, Jiann-Shiun Yuan, Shuyu Chen (2011)

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DOI: 10.1016/J.MICROREL.2011.03.027

access: closed

type: Journal Article

metadata version: 2020-02-22

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Karan Kutty, Jiann-Shiun Yuan, Shuyu Chen:
Evaluation of gate oxide breakdown effect on cascode class E power amplifier performance. Microelectron. Reliab. 51(8): 1302-1308 (2011)

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