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"Feature extraction and damage-precursors for prognostication of lead-free ..."
Pradeep Lall et al. (2007)
- Pradeep Lall, Madhura Hande, Chandan Bhat, Nokibul Islam, Jeff Suhling, Jay Lee:
Feature extraction and damage-precursors for prognostication of lead-free electronics. Microelectron. Reliab. 47(12): 1907-1920 (2007)
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