Stop the war!
Остановите войну!
for scientists:
default search action
"Improved reliability of large-sized a-Si thin-film-transistor by back ..."
Hao-Chieh Lee, Kuei-Shu Chang-Liao, Yan-Lin Li (2015)
- Hao-Chieh Lee, Kuei-Shu Chang-Liao, Yan-Lin Li:
Improved reliability of large-sized a-Si thin-film-transistor by back channel treatment in H2. Microelectron. Reliab. 55(11): 2178-2182 (2015)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.