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"Random telegraph signal: A sensitive and nondestructive tool for gate ..."

Cédric Leyris et al. (2007)

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DOI: 10.1016/J.MICROREL.2007.01.034

access: closed

type: Journal Article

metadata version: 2020-11-03

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Cédric Leyris, Frédéric Martinez, M. Valenza, Alain Hoffmann, J. C. Vildeuil:
Random telegraph signal: A sensitive and nondestructive tool for gate oxide single trap characterization. Microelectron. Reliab. 47(4-5): 573-576 (2007)

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