"System-level variation-aware aging simulator using a unified novel ..."

Taizhi Liu et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.008

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type: Journal Article

metadata version: 2022-01-03

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Taizhi Liu, Chang-Chih Chen, Soonyoung Cha, Linda Milor:
System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown. Microelectron. Reliab. 55(9-10): 1334-1340 (2015)

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