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"Comprehensive reliability and aging analysis on SRAMs within ..."

Taizhi Liu et al. (2015)

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DOI: 10.1016/J.MICROREL.2015.06.078

access: closed

type: Journal Article

metadata version: 2022-01-03

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Taizhi Liu, Chang-Chih Chen, Woongrae Kim, Linda Milor:
Comprehensive reliability and aging analysis on SRAMs within microprocessor systems. Microelectron. Reliab. 55(9-10): 1290-1296 (2015)

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