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"Study of forward AC stress degradation of GaN-on-Si Schottky diodes."
Thomas Lorin et al. (2018)
- Thomas Lorin, William Vandendaele, Romain Gwoziecki, Charlotte Gillot, Jérome Biscarrat, Gérard Ghibaudo
, Fred Gaillard:
Study of forward AC stress degradation of GaN-on-Si Schottky diodes. Microelectron. Reliab. 88-90: 641-644 (2018)
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