"Study of forward AC stress degradation of GaN-on-Si Schottky diodes."

Thomas Lorin et al. (2018)

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DOI: 10.1016/J.MICROREL.2018.07.103

access: closed

type: Journal Article

metadata version: 2022-01-03

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Thomas Lorin, William Vandendaele, Romain Gwoziecki, Charlotte Gillot, Jérome Biscarrat, Gérard Ghibaudo, Fred Gaillard:
Study of forward AC stress degradation of GaN-on-Si Schottky diodes. Microelectron. Reliab. 88-90: 641-644 (2018)

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